Author(s): Rogers JM, Panegyres PK
Cognitive impairment is common in multiple sclerosis (MS), occurring at all stages of the disease, and can be a major source of vocational disability, social impairment, and impoverished quality of life. Dysfunction in free recall from long-term memory, speed of information processing, working memory, and abstract reasoning are frequently observed in MS. Despite weak correlation with disease duration and physical disability status, the degree of cognitive impairment in MS has been related to the extent of topographically specific neuronal tissue damage and loss. Additional clinical factors including disease course, fatigue, affective disturbance, and medication can impact on the degree of MS-related cognitive impairment. We suggest that the symbol digits modalities test, paced auditory serial addition task, the clock drawing test and the MS neuropsychological screening questionnaire be considered as valid and relevant screening tests for cognitive impairment in MS.
Referred From: https://pubmed.ncbi.nlm.nih.gov/17659875/
Author(s): Benedict RH, Hulst HE, Bergsland N, Schoonheim MM, Dwyer MG, et al.
Author(s): Brassington JC, Marsh NV
Author(s): Beatty WW, Wilbanks SL, Blanco CR, Hames KA, Tivis R, et al.
Author(s): Litvan I, Grafman J, Vendrell P, Martinez JM
Author(s): DeLuca J, Chelune, GJ, Tulsky DS, Lengenfelder J, Chiaravalloti ND
Author(s): Denney DR, Sworowski LA, Lynch SG
Author(s): Grafman J, Rao S, Bernardin L, Leo GJ
Author(s): Bergendal G, Fredrikson S, Almkvist O
Author(s): Cosentino S, Jefferson A, Chute DL, Kaplan E, Libon DJ
Author(s): Libon DJ, Malamut BL, Swenson R, Sands LP, Cloud BS
Author(s): Barak Y, Lavie M, Achiron A
Author(s): Benito-León J, Morales JM, Rivera-Navarro J
Author(s): McDonald WI, Compston A, Edan G, Goodkin D, Hartung HP, et al.
Author(s): Polman CH, Reingold SC, Edan G, Filippi M, Hartung HP, et al.
Author(s): Kurtzke JF
Author(s): Joy S, Kaplan E, Fein D
Author(s): Price CC, Garrett KD, Jefferson AL, Cosentino S, Tanner JJ, et al.
Author(s): Shoyama M, Nishioka T, Okumura M, Kose A, Tsuji T, et al.